Renesas H8S/2668 Series Informações Técnicas Página 40

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18) Test Parallel Access
A) Internal ROM Parallel Read Access(WORD) .........OK
B) Internal ROM Parallel Write Access(WORD) ........OK
C) Internal ROM Parallel Write Access(High Byte) ...OK
D) Internal ROM Parallel Write Access(Low Byte) ....OK
E) Internal RAM Parallel Read Access(WORD) .........OK
F) Internal RAM Parallel Write Access(WORD) ........OK
G) Internal RAM Parallel Write Access(High Byte) ...OK
H) Internal RAM Parallel Write Access(Low Byte) ....OK
I) Option RAM Parallel Read Access(WORD) ...........SKIP
J) Option RAM Parallel Write Access(WORD) ..........SKIP
K) Option RAM Parallel Write Access(High Byte) .....SKIP
L) Option RAM Parallel Write Access(Low Byte) ......SKIP
Shows the check results for the
parallel access controlling
circuits in the E6000 (normal
completion).
19) Test RTC
A) RTC .......................................OK
Shows the check results for the
RTC controlling circuits in the
E6000 (normal completion).
Tests run for xH:xM:xS Shows the check time.
Tests passed, emulator functioning correctly Shows that the E6000 is
correctly operating.
When –S is added to the command line, step 1 will be executed again after step 19.
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